The 4033 and 4034 are high performance programmable pulse generators for testing digital systems and circuits based on TTL, CMOS, or ECL technologies. These instruments generate clean and accurate pulses at up to 6 digits resolution with a repetition rate up to 50 MHz, variable pulse widths from 10 ns to 10 s, and pulse delays from 0 ns to 10 s. Output levels are adjustable from -10 V to +10 V, with pulse amplitudes settable from 0.1 Vpp to 10 Vpp into a 50 ohm load. All parameters, modes, and functions are programmable via the front panel or remote control commands. Additionally, the pulse generators provide selectable complementary pulse and double pulse generation in continuous, triggered, gated, and counted burst modes.

• Repetition rate of 0.1 Hz to 50 MHz
• Dual channel operation (4034 only): Both channels offer full functionality and all parameters such as pulse width and transition time can be set independently. Channels can be synchronized with with the push of a button
• Flexible trigger modes: Continuous, Triggered (internal, external, manual), Gated Burst and External Width
• Pulse width programmable from 10 ns to 10 s
• Transition times (rise and fall times) variable from 6 ns to 100 ms
• Programmable delay and double pulse
• Store up to 99 different test setups with auto retention of last power down setup
• 10 Vpp into 50 ohm output
• Closed case calibration
• Programmable via GPIB and RS-232
• SCPI compatible

Applications

• Automatic Test Equipment (ATE)
• Avionics and radar testing
• Switching power supply testing
• Characterization of active components